OcrV1, Main, Exploration, bibRecord, 000276

X-ray microanalysis: the state of the art of SDD detectors and WDS systems on scanning electron microscopes (SEM)

Identifieur interne : 000276 ( Main/Exploration ); précédent : 000275; suivant : 000277

X-ray microanalysis: the state of the art of SDD detectors and WDS systems on scanning electron microscopes (SEM)

Auteurs : L. Maniguet [France] ; F. Robaut [France] ; A. Meuris [France] ; F. Roussel-Dherbey [France] ; F. Chariot [France]

Source :

IOP Conference Series: Materials Science and Engineering [ 1757-899X ] ; 2012-03-07.

RBID : ISTEX:DE2095704038DF65A94D770D17649920C788BB46
Url:

https://api.istex.fr/document/DE2095704038DF65A94D770D17649920C788BB46/fulltext/pdf

DOI: 10.1088/1757-899X/32/1/012015

Affiliations:

Links toward previous steps (curation, corpus...)

to stream Istex, to step Corpus: 000576
to stream Istex, to step Curation: 000568
to stream Istex, to step Checkpoint: 000011
to stream Main, to step Merge: 000279
to stream Main, to step Curation: 000276

Le document en format XML

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X-ray microanalysis: the state of the art of SDD detectors and WDS systems on scanning electron microscopes (SEM)

X-ray microanalysis: the state of the art of SDD detectors and WDS systems on scanning electron microscopes (SEM)

Source :

Links toward previous steps (curation, corpus...)

Le document en format XML

Pour manipuler ce document sous Unix (Dilib)

Pour mettre un lien sur cette page dans le réseau Wicri